Romtek® is the registered trade mark of Bhushan & Bhushan

Short Description

This apparatus demonstrates graphically the wave phenomena of double slit interference. The model is x20,000 larger than the actual experimental conditions of 600nm He/Ne laser illumination, and a variable slit width of 4.5 microns and 2.25 microns. Using these parameters mathematical calculations can be made to complement the demonstration with quantitative analysis of a high degree of accuracy. A phase adjuster allows the incident wave front of one slit to be thrown out of phase with respect to the other slit to show this effect on the interference pattern as seen on the screen. Overall size 570x400mm